Evidence for size effects on interfacial widths in confined thin films

被引:83
作者
Kerle, T [1 ]
Klein, J [1 ]
Binder, K [1 ]
机构
[1] UNIV MAINZ,INST PHYS,D-55099 MAINZ,GERMANY
关键词
D O I
10.1103/PhysRevLett.77.1318
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
When a film of thickness D of a binary mixture on a substrate segregates into two coexisting phases, an interface between the phases parallel to the substrate may form due to preferential surface attraction of one of them. It is argued then that the correlation length xi(parallel to) for interfacial fluctuations parallel to this interface (ln xi(parallel to) proportional to D) leads to a size-dependent interfacial width w proportional to root D. Nuclear reaction depth profiling experiments on polymer mixtures as well as Ising model simulations both support this prediction.
引用
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页码:1318 / 1321
页数:4
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