Recording performances in perpendicular magnetic patterned media

被引：8

作者：

Asbahi, M. ^{[1
,2
]}

Moritz, J. ^{[1
,2
]}

Dieny, B. ^{[2
]}

Gourgon, C. ^{[3
]}

Perret, C. ^{[3
]}

van de Veerdonk, R. J. M. ^{[4
]}

机构：

[1] CEA CNRS UJF Grenoble INP, SPINTEC, UMR8191, F-38054 Grenoble, France

[2] CEA INAC, F-38054 Grenoble, France

[3] Lab Technol Microelect, F-38054 Grenoble, France

[4] Seagate Recording Media Operat, Fremont, CA 94538 USA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2010年 / 43卷 / 38期

关键词：

DOT ARRAYS; DENSITY; STORAGE; SIGNAL; REVERSAL; ROUTE;

D O I：

10.1088/0022-3727/43/38/385003

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on the recording performances and signal-to-noise ratio (SNR) analyses of perpendicular magnetic bit-patterned media. Two different types of magnetic samples are investigated. They differ by the way that they were patterned (nano-imprint versus e-beam lithography) as well as their magnetic properties (Co/Pt multilayers and CoCrPt alloy are the recording layers). Using a contact read/write quasi-static tester, we were able to characterize the write windows, the bit error rates and measure the SNR. The influence of magnetic properties and media microstructure on the writing processes is studied. We show also that the lithographical method used to replicate the media induces more or less noise due to structural distributions.

引用

页数：6

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