Features extraction and analysis for classifying causable patterns in control charts

被引:32
作者
Assaleh, K [1 ]
Al-Assaf, Y [1 ]
机构
[1] Amer Univ Sharjah, Sharjah, U Arab Emirates
关键词
control charts; neural networks; multi-resolution wavelet analysis discrete cosine transform;
D O I
10.1016/j.cie.2005.01.021
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Obtaining adequate features is a critical step in classifying causable patterns in control charts. Various methods were developed to extract features that maximize the inter-class variability while minimizing the intra-class variations. Most of these methods are based on either time or frequency domain analysis. As a multi-resolution analysis approach, wavelet transform was considered to exploit the joint time-frequency characteristics of the patterns. However, the effectiveness of the features obtained by multi-resolution wavelet analysis (MRWA) suffers from the frequency leakage among the different spectral bands. This phenomenon is inherent in wavelet analysis regardless of the choice of the mother wavelet. Cross-band frequency leakage smears the band-specific information, which may yield less distinguishing features, especially for short-time observation patterns. In this work we introduce a multi-resolution analysis approach based on discrete cosine transform (DCT) that overcomes the problems associated with MRWA. We also verify that the classification rates of shift, trend, and cyclic causable patterns using multi-resolution DCT (MRDCT) features are higher than those obtained using MRWA features. Furthermore, the computational requirements for MRDCT are notably less than those needed for MRWA. Artificial neural network (ANN) classifier was used with both feature extraction methods. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:168 / 181
页数:14
相关论文
共 21 条
[1]   Recognition of control chart patterns using multi-resolution wavelets analysis and neural networks [J].
Al-Assaf, Y .
COMPUTERS & INDUSTRIAL ENGINEERING, 2004, 47 (01) :17-29
[2]  
Bakshi BR, 1999, J CHEMOMETR, V13, P415, DOI 10.1002/(SICI)1099-128X(199905/08)13:3/4<415::AID-CEM544>3.0.CO
[3]  
2-8
[4]  
Burrus C.S., 1998, introduction to Wavelets and Wavelet Transforms-A Primer
[5]   A neural network approach for the analysis of control chart patterns [J].
Cheng, CS .
INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 1997, 35 (03) :667-697
[6]  
DONOHO DL, 1995, J ROYAL STAT SOC B, V57, P41
[7]  
Duncan A., 1986, Quality control and industrial statistics, V5th
[8]  
Gonzalez R., 2019, Digital Image Processing, V2nd
[9]  
Grant E., 1996, Statistical Quality Control
[10]   Recognition of control chart concurrent patterns using a neural network approach [J].
Guh, RS ;
Tannock, JDT .
INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 1999, 37 (08) :1743-1765