Manipulation of nanoparticles using dynamic force microscopy: simulation and experiments

被引：55

作者：

Resch, R ^{[1
]}

Bugacov, A ^{[1
]}

Baur, C ^{[1
]}

Koel, BE ^{[1
]}

Madhukar, A ^{[1
]}

Requicha, AAG ^{[1
]}

Will, P ^{[1
]}

机构：

[1] Univ So Calif, Lab Mol Robot, Los Angeles, CA 90089 USA

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 67卷 / 03期

关键词：

D O I：

10.1007/s003390050769

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Dynamic force microscopy (DFM) in combination with special-purpose probe control software is used as a manipulation tool for the precise positioning of single gold nanoparticles on a mica substrate covered with a poly-L-lysine film. Experimental results are presented that show how to construct arbitrary patterns of nanoparticles. The dynamic state of the cantilever during the manipulation process is studied experimentally by analyzing the simultaneously recorded non-contact amplitude and cantilever deflection. Numerical simulations guide and supplement the experiments in order to provide a physical description of the manipulation mechanism. The results presented here show that the nanoparticles are pushed along the surface once a critical contact force between tip and gold cluster is exceeded. In addition, a method for estimating the average separation between the tip apex and the sample in DFM is described.

引用

页码：265 / 271

页数：7

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