Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics

被引：4

作者：

Moritz, P ^{[1
]}

Berdermann, E ^{[1
]}

Blasche, K ^{[1
]}

Rödl, H ^{[1
]}

Stelzer, H ^{[1
]}

Zeytouni, F ^{[1
]}

机构：

[1] Gesell Schwerionenforsch GmbH, D-64291 Darmstadt, Germany

来源：

BEAM INSTRUMENTATION WORKSHOP | 1998年 / 451卷

关键词：

D O I：

10.1063/1.57055

中图分类号：

O412 [相对论、场论]; O572.2 [粒子物理学];

学科分类号：

摘要：

The application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond 10(8) pps can be analyzed while maintaining single-particle time resolution below fractions of a nanosecond. With segmented electrode structures on the diamond surface, higher particle count rates and improved monitoring of x/y beam profiles can be achieved. Diamond detectors with areas up to 30x30 mm(2) for a precise measurement system for beam intensity, beam profiles, and spill time-structure are described.

引用

页码：514 / 521

页数：8