Random pyramidal texture modelling

被引:40
作者
Rodriguez, JM
Tobias, I
Luque, A
机构
[1] Instituto de Energia Solar, Univ. Politécnica de Madrid, Ciudad Universitaria
关键词
ray tracing; light confinement; pyramidal texture; reflectance;
D O I
10.1016/S0927-0248(96)00040-2
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
A simple model of random pyramidal texture is presented here for its implementation on a ray tracing program. Several simulations have been done in which it has been studied how the distribution of sizes of pyramids affects the reflectivity. On the basis of this model wafers with front and/or back textured faces are analyzed leading to the conclusion that no metal coating is necessary for a strong confinement of the light.
引用
收藏
页码:241 / 253
页数:13
相关论文
共 5 条
[1]  
BRENDEL R, 1994, USER HDB
[2]  
KING DL, 1991, 22 IEEE PHOT SPEC C, P303
[3]  
RODRIGUEZ JM, 1993, ESTUDIO PROPIEDADES
[4]  
SMITH AW, 1992, TEXTURE RAY TRACING
[5]   EXPERIMENTAL EXTRACTION OF LIGHT CONFINEMENT PARAMETERS FOR TEXTURED SILICON-WAFERS [J].
TOBIAS, I ;
RODRIGUEZ, JM ;
LUQUE, A .
PROGRESS IN PHOTOVOLTAICS, 1995, 3 (03) :177-187