How to measure patent thickets-A novel approach

被引：62

作者：

von Graevenitz, Georg ^{[2
]}

Wagner, Stefan ^{[1
,2
]}

Harhoff, Dietmar ^{[2
,3
]}

机构：

[1] European Sch Management & Technol, D-10178 Berlin, Germany

[2] Univ Munich, LMU Munich Sch Management, INNO Tec, D-80539 Munich, Germany

[3] Ctr Econ Policy Res, London SW1Y 6LA, England

来源：

ECONOMICS LETTERS | 2011年 / 111卷 / 01期

关键词：

Patenting; Patent thickets; Patent portfolio races; Complexity;

D O I：

10.1016/j.econlet.2010.12.005

中图分类号：

F [经济];

学科分类号：

02 ;

摘要：

This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：6 / 9

页数：4

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