Enhancement of dielectric strength in nanocomposites

被引:76
作者
Tuncer, Enis
Sauers, Isidor
Randy James, D.
Ellis, Alvin R.
Parans Paranthaman, M.
Goyal, Amit
More, Karren L.
机构
[1] Oak Ridge Natl Lab, Div Fus Energy, Appl Superconduct Grp, Oak Ridge, TN 37831 USA
[2] Oak Ridge Natl Lab, Mat Chem Grp, Div Chem Sci, Oak Ridge, TN 37831 USA
[3] Oak Ridge Natl Lab, Superconduct & Energy Efficient Mat Grp, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
[4] Oak Ridge Natl Lab, Microscopy Microanal & Microstruct Grp, Mat Sci & Technol Div, Oak Ridge, TN 37831 USA
关键词
D O I
10.1088/0957-4484/18/32/325704
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper, we report the dielectric breakdown properties of a nanocomposite, a potential electrical insulation material for cryogenic high voltage applications. The material is composed of a high molecular weight polyvinyl alcohol and nanosized in situ synthesized titanate particles. The dielectric breakdown strengths of the filled material samples, measured in liquid nitrogen, indicate a significant increase in their strengths as compared to unfilled polyvinyl alcohol. We conclude that nanometre-sized particles can be adopted as a voltage stabilization additive.
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页数:5
相关论文
共 19 条
[1]   Nanoparticle polymer composites: Where two small worlds meet [J].
Balazs, Anna C. ;
Emrick, Todd ;
Russell, Thomas P. .
SCIENCE, 2006, 314 (5802) :1107-1110
[2]  
BENZ ME, 2005, Patent No. 6879861
[3]  
Cao Y, 2004, IEEE T DIELECT EL IN, V11, P797
[4]   THE EFFECT OF ALUMINUM INCLUSIONS ON THE DIELECTRIC-BREAKDOWN OF POLYETHYLENE [J].
COPPARD, RW ;
BOWMAN, J ;
DISSADO, LA ;
ROWLAND, SM ;
RAKOWSKI, RT .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (12) :1554-1561
[5]   Predicting electrical breakdown in polymeric insulators - From deterministic mechanisms to failure statistics [J].
Dissado, LA .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2002, 9 (05) :860-875
[6]   THEORETICAL BASIS FOR THE STATISTICS OF DIELECTRIC-BREAKDOWN [J].
DISSADO, LA .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (12) :1582-1591
[7]   PROBABILITY PLOT CORRELATION COEFFICIENT TEST FOR NORMALITY [J].
FILLIBEN, JJ .
TECHNOMETRICS, 1975, 17 (01) :111-117
[8]   ESTIMATING THE CUMULATIVE PROBABILITY OF FAILURE DATA POINTS TO BE PLOTTED ON WEIBULL AND OTHER PROBABILITY PAPER [J].
FOTHERGILL, JC .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1990, 25 (03) :489-492
[9]   Introductory remarks on nanodielectrics [J].
Fréchette, MF ;
Trudeau, ML ;
Alamdari, HD ;
Boily, S .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2004, 11 (05) :808-818
[10]   Properties of cryogenic insulants [J].
Gerhold, J .
CRYOGENICS, 1998, 38 (11) :1063-1081