Electronic interaction at the TiO2-Al2O3 interface as observed by X-ray absorption spectroscopy

被引:24
作者
Sánchez-Agudo, M
Soriano, L [1 ]
Quirós, C
Avila, J
Sanz, JM
机构
[1] Univ Autonoma Madrid, Inst Ciencia Mat Nicolas Cabrera, Dept Fis Aplicada, E-28049 Madrid, Spain
[2] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain
[3] Univ Paris 11, LURE, F-91405 Orsay, France
关键词
near edge extended X-ray absorption fine structure (NEXAFS); interface states; aluminum oxide; titanium oxide; coatings; insulating films;
D O I
10.1016/S0039-6028(00)01048-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The electronic structure of the TiO2-Al2O3 interface has been studied using X-ray absorption spectroscopy. Special attention has been paid to the early stages of growth. i.e. the sub-monolayer regime (theta < 1). The Ti 2p spectra for coverages below 1 ML show significant changes with respect to those for large coverages and bulk TiO2 indicating the presence of interfacial states. The spectra have been compared with atomic multiplet calculations reported in the literature. From this comparison it is concluded that strong electronic interactions occur at the interface, as deduced from the significant lowering of the crystal field of the Ti atoms at the interface (1.0 eV) as compared with bulk TiO2 (1.8 ev). It is suggested that the important covalent character of the bonding of the Al2O3 substrate is the responsible of this crystal field lowering. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:470 / 475
页数:6
相关论文
共 26 条
[1]   PROBING DEPTH OF SOFT-X-RAY ABSORPTION-SPECTROSCOPY MEASURED IN TOTAL-ELECTRON-YIELD MODE [J].
ABBATE, M ;
GOEDKOOP, JB ;
DEGROOT, FMF ;
GRIONI, M ;
FUGGLE, JC ;
HOFMANN, S ;
PETERSEN, H ;
SACCHI, M .
SURFACE AND INTERFACE ANALYSIS, 1992, 18 (01) :65-69
[2]   ELECTRON-ENERGY LOSS AND X-RAY ABSORPTION-SPECTROSCOPY OF RUTILE AND ANATASE - A TEST OF STRUCTURAL SENSITIVITY [J].
BRYDSON, R ;
SAUER, H ;
ENGEL, W ;
THOMAS, JM ;
ZEITLER, E ;
KOSUGI, N ;
KURODA, H .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (04) :797-812
[3]   STRUCTURAL-PROPERTIES OF EPITAXIAL TIO2 FILMS GROWN ON SAPPHIRE (11(2)OVER-BAR-0) BY MOCVD [J].
CHANG, HLM ;
YOU, H ;
GAO, Y ;
GUO, J ;
FOSTER, CM ;
CHIARELLO, RP ;
ZHANG, TJ ;
LAM, DJ .
JOURNAL OF MATERIALS RESEARCH, 1992, 7 (09) :2495-2506
[4]   EPITAXY, MICROSTRUCTURE, AND PROCESSING-STRUCTURE RELATIONSHIPS OF TIO2 THIN-FILMS GROWN ON SAPPHIRE (0001) BY MOCVD [J].
CHANG, HLM ;
ZHANG, TJ ;
ZHANG, H ;
GUO, J ;
KIM, HK ;
LAM, DJ .
JOURNAL OF MATERIALS RESEARCH, 1993, 8 (10) :2634-2643
[5]   OXYGEN 1S X-RAY-ABSORPTION OF TETRAVALENT TITANIUM-OXIDES - A COMPARISON WITH SINGLE-PARTICLE CALCULATIONS [J].
DEGROOT, FMF ;
FABER, J ;
MICHIELS, JJM ;
CZYZYK, MT ;
ABBATE, M ;
FUGGLE, JC .
PHYSICAL REVIEW B, 1993, 48 (04) :2074-2080
[6]   L2,3 X-RAY-ABSORPTION EDGES OF D0 COMPOUNDS - K+, CA-2+, SC-3+ AND TI-4+ IN OH (OCTAHEDRAL) SYMMETRY [J].
DEGROOT, FMF ;
FUGGLE, JC ;
THOLE, BT ;
SAWATZKY, GA .
PHYSICAL REVIEW B, 1990, 41 (02) :928-937
[7]   2P X-RAY ABSORPTION OF 3D TRANSITION-METAL COMPOUNDS - AN ATOMIC MULTIPLET DESCRIPTION INCLUDING THE CRYSTAL-FIELD [J].
DEGROOT, FMF ;
FUGGLE, JC ;
THOLE, BT ;
SAWATZKY, GA .
PHYSICAL REVIEW B, 1990, 42 (09) :5459-5468
[8]   Synchrotron photoemission characterization of TiO2 supported on SiO2 [J].
Espinos, JP ;
Lassaletta, G ;
Caballero, A ;
Fernandez, A ;
Gonzalez-Elipe, AR ;
Stampfl, A ;
Morant, C ;
Sanz, JM .
LANGMUIR, 1998, 14 (17) :4908-4914
[9]   Atomic-oxygen-assisted MBE growth of α-Fe2O3 on α-Al2O3(0001):: Metastable FeO(111)-like phase at subnanometer thicknesses [J].
Gota, S ;
Guiot, E ;
Henriot, M ;
Gautier-Soyer, M .
PHYSICAL REVIEW B, 1999, 60 (20) :14387-14395
[10]   UNOCCUPIED ELECTRONIC STATES OF CUO - AN OXYGEN 1S X-RAY-ABSORPTION SPECTROSCOPY INVESTIGATION [J].
GRIONI, M ;
CZYZYK, MT ;
DEGROOT, FMF ;
FUGGLE, JC ;
WATTS, BE .
PHYSICAL REVIEW B, 1989, 39 (08) :4886-4890