Analytical descriptions of the tapping-mode atomic force microscopy response

被引：68

作者：

Wang, L ^{[1
]}

机构：

[1] Ohio State Univ, Edison Joining Technol Ctr, Columbus, OH 43210 USA

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 25期

关键词：

D O I：

10.1063/1.122893

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The tapping-mode atomic force microscopy response has been analyzed by the Krylov-Bogolubov-Mitropolsky asymptotic method. Due to the presence of repulsive force, attractive force and damping in the tip-sample interaction, the response exhibits complicate nonlinear phenomena. The numerical and experimental results shows that the phenomena can be well described by this approximation solution when the driving frequency is close to the free resonance frequency and the setpoint amplitude ratio is larger than 0.4. (C) 1998 American Institute of Physics. [S0003-6951(98)04551-3].

引用

页码：3781 / 3783

页数：3

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