A surface science study of model catalysts.: 1.: Quantitative surface analysis of wet-chemically prepared Cu/SiO2 model catalysts

被引:13
作者
van den Oetelaar, LCA
Partridge, A
Stapel, PJA
Flipse, CFJ
Brongersma, HH
机构
[1] Eindhoven Univ Technol, Fac Phys, NL-5600 MB Eindhoven, Netherlands
[2] Eindhoven Univ Technol, Schuit Inst Catalysis, NL-5600 MB Eindhoven, Netherlands
关键词
D O I
10.1021/jp982998e
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Cu/SiO2 model catalysts containing nanometer-sized Cu particles on a flat silica model support were wet-chemically prepared and characterized in detail by a variety of surface science techniques. The particle size and shape, particle number density, metal surface coverage, total metal loading, and oxidation state of the particles were determined by ultrahigh vacuum atomic force microscopy, electron microscopy, low-energy ion scattering, Rutherford backscattering spectrometry, and X-ray photoelectron spectroscopy. Deposition of a Cu precursor on a flat Si wafer with a SiO2 top layer by spin-coating was followed by calcination in air at 450 degrees C. This preparation method produces both homogeneously distributed hemispherical CuO particles with an average height of 8 nm and highly dispersed oxidic Cu species. Subsequent reduction in hydrogen at 250 degrees C results in metallic and more rounded Cu particles with an average height of 8 nm.
引用
收藏
页码:9532 / 9540
页数:9
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