Deconvolution of Thomson scattering temperature profiles

被引：20

作者：

Scannell, R. ^{[1
]}

Beurskens, M. ^{[1
]}

Carolan, P. G. ^{[1
]}

Kirk, A. ^{[1
]}

Walsh, M. ^{[1
]}

O'Gorman, T. ^{[2
]}

Osborne, T. H. ^{[3
]}

机构：

[1] EURATOM CCFE Fus Assoc, Culham Sci Ctr, Abingdon OX14 3DB, Oxon, England

[2] Univ Coll Cork, Dept Phys, Cork, Ireland

[3] Gen Atom Co, San Diego, CA 92186 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2011年 / 82卷 / 05期

关键词：

SPECTRUM; PLASMA;

D O I：

10.1063/1.3581230

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Deconvolution of Thomson scattering (TS) profiles is required when the gradient length of the electron temperature (T(e)) or density (n(e)) are comparable to the instrument function length (Delta R). The most correct method for deconvolution to obtain underlying T(e) and n(e) profiles is by consideration of scattered signals. However, deconvolution at the scattered signal level is complex since it requires knowledge of all spectral and absolute calibration data. In this paper a simple technique is presented where only knowledge of the instrument function I (r) and the measured profiles, T(e,observed)(r) and n(e,observed)(r), are required to obtain underlying T(e)(r) and n(e)(r). This method is appropriate for most TS systems and is particularly important where high spatial sampling is obtained relative to Delta(g). [doi: 10.1063/1.3581230]

引用

页数：8

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