Quantitative measurements of segregation in Co-Cr-X magnetic recording media by energy-filtered transmission electron microscopy
被引:5
作者:
Bentley, J
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h-index: 0
机构:
Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA
Bentley, J
[1
]
Wittig, JE
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h-index: 0
机构:
Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA
Wittig, JE
[1
]
Nolan, TP
论文数: 0引用数: 0
h-index: 0
机构:
Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USAOak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA
Nolan, TP
[1
]
机构:
[1] Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA
来源:
HIGH-DENSITY MAGNETIC RECORDING AND INTEGRATED MAGNETO-OPTICS: MATERIALS AND DEVICES
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1998年
/
517卷
关键词:
D O I:
10.1557/PROC-517-205
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Reliable core-loss spectroscopic methods have been developed for mapping elemental segregation in Co-Cr-X magnetic recording media by energy-filtered transmission electron microscopy. Extraction of quantitative compositions at a spatial resolution approaching 1 nm involves sophisticated treatments for diffraction contrast, variations in specimen thickness, and closely-spaced oxygen K and chromium L-23 ionization edges. These methods reveal that intergranular chromium levels are similar to 25 at.% for random-angle boundaries and similar to 25 at.% for 90 degrees boundaries in films of Co84Cr12Ta4 d.c. magnetron sputtered at 250 degrees C.