Magnetic anisotropy of epitaxial cobalt ferrite thin films

被引:137
作者
Suzuki, Y [1 ]
Hu, G
van Dover, RB
Cava, RJ
机构
[1] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
[2] Lucent Technol, Murray Hill, NJ 07974 USA
[3] Princeton Univ, Dept Chem, Princeton, NJ 08544 USA
基金
美国国家科学基金会;
关键词
anisotropy magnetic; epitaxial thin films; cobalt ferrite;
D O I
10.1016/S0304-8853(98)00364-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have fabricated epitaxial single crystalline cobalt ferrite (CoFe2O4) thin films on CoCr2O4 buffered SrTiO3 and MgAl2O4 substrates. Structural characterization by X-ray diffraction, Rutherford backscattering spectroscopy and atomic force microscopy indicates excellent crystallinity. Magnetic anisotropy measurements in the in-plane and perpendicular directions as a function of film thickness provide strong evidence for the dominant role of strain in the magnetic anisotropy. Cobalt ferrite (1 0 0) films grown under compression have an easy [0 0 1] and hard [0 1 1] direction in the plane and [1 0 0] direction out of the plane of the him. Cobalt ferrite (1 1 0) films grown under compression give rise to an easy [0 0 1] and a hard [1 (1) over bar 0] directions in the plane of the film and a hard axis perpendicular to the film. Films grown under tension give rise to an easy axis perpendicular to the film. These observations are explained using magneto-elastic theory. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1 / 8
页数:8
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