Photometric methods for determining the optical constants and the thicknesses of thin absorbing films: selection of a combination of photometric quantities on the basis of error analysis

被引:17
作者
Babeva, T [1 ]
Kitova, S [1 ]
Konstantinov, I [1 ]
机构
[1] Bulgarian Acad Sci, Cent Lab Photoproc, BU-1113 Sofia, Bulgaria
关键词
D O I
10.1364/AO.40.002675
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We select the best combinations of spectrophotometric quantities far the most accurate determination of the optical constants, n (refractive index), k (absorption coefficient), and the thicknesses of thin absorbing films. The basic comparative criteria used are the maximum absolute errors in the determination of n, k, and d that result from experimental errors in photometric measurements and in the optical constants of the substrates. We studied all possible combinations of photometric quantities T, T-s(theta), T-p(theta), R, R-s(theta), R-p(theta), R-m, R-ms(theta), and R-mp(theta), at 0 degrees < theta less than or equal to 70 degrees where T denotes transmission; R, reflection; the subscripts s and p, s- andp-polarized light; m, reflection from a thin film coated upon an opaque substrate; and superscript theta, the angle of incidence of light. The absence of the subscripts s and p implies nonpolarized light; that of the subscript m, a nonabsorbing substrate; and that of superscript theta, normally incident light. The error analysis that is made admits the following conclusions: (1) The best double combinations are (TR), (TRm), (TRp70), and (TRmp70); (2) the best triple combinations are (TRRm), (TRRp70), (TRRmp70), (TRmRp70), and (TRmRmp70); (3) the methods indicated above, suitably combined, are quite sufficient to provide the maximum accuracy and reliability of n, h, and d for all practical situations; (4) TRR methods based on measurements with obliquely polarized light are more suitable for thin films with n < 1, such as some metal films; (5) the regions of n, k, and d/<lambda> with the highest and the lowest accuracies do not overlap in either the TR or the TRR methods. Hence more combinations, preferably all, should be applied for the most accurate determination of n, h (and d), and the errors should be evaluated as a criterion for the best combination. (C) 2001 Optical Society of America.
引用
收藏
页码:2675 / 2681
页数:7
相关论文
共 16 条
[1]   DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
STUDNA, AA .
PHYSICAL REVIEW B, 1983, 27 (02) :985-1009
[2]   Simultaneous measurement of spectral optical properties and thickness of an absorbing thin film on a substrate [J].
Chen, JJ ;
Lin, JD ;
Sheu, LJ .
THIN SOLID FILMS, 1999, 354 (1-2) :176-186
[3]   DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS FROM MEASUREMENTS OF REFLECTANCE AND TRANSMITTANCE AT NORMAL INCIDENCE [J].
DENTON, RE ;
TOMLIN, SG ;
CAMPBELL, RD .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (04) :852-&
[4]   Determination of optical constants of thin absorbing films from normal incidence reflectance and transmittance measurements [J].
Djurisic, AB ;
Fritz, T ;
Leo, K .
OPTICS COMMUNICATIONS, 1999, 166 (1-6) :35-42
[5]   OPTICAL CHARACTERIZATION OF THIN-FILMS - THEORY [J].
HANSEN, WN .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1973, 63 (07) :793-802
[6]  
Heavens O. S., 1955, OPTICAL PROPERTIES T, P55
[8]   Analysis of errors in thin-film optical parameters derived from spectrophotometric measurements at normal light incidence [J].
Konstantinov, I ;
Babeva, T ;
Kitova, S .
APPLIED OPTICS, 1998, 37 (19) :4260-4267
[9]   Problem of ambiguity in the determination of optical constants of thin absorbing films from spectroscopic reflectance and transmittance measurements [J].
Lamprecht, K ;
Papousek, W ;
Leising, G .
APPLIED OPTICS, 1997, 36 (25) :6364-6371
[10]  
LIDDELL HM, 1981, COMPUTER AIDED TECHN, P118