Thermal stability of ultra-thin Co recording media

被引:10
作者
Gong, H [1 ]
Yang, W
Lambeth, DN
Rao, M
Laughlin, DE
机构
[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA
[2] Carnegie Mellon Univ, Dept Mat Sci & Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会; 美国安德鲁·梅隆基金会;
关键词
thermal stability; magnetic viscosity; superparamagnetism; magnetic recording media;
D O I
10.1109/20.706632
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Ultra-thin Co/Cr films were fabricated by RF diode sputtering. The highly exchange coupled Co grains were successfully isolated by post deposition processing. The microstructure was studied with TEM and a very small physical grain size was observed. The measurement of Delta M curves showed that the grain to grain interaction changed from positive to negative. Time dependent magnetic measurements showed significant thermal decay effects. It was also found that the use of CrMn underlayers instead of pure Cr further isolated the Co grains.
引用
收藏
页码:1612 / 1614
页数:3
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