Very high frequency and microwave interferometric phase and amplitude noise measurements

被引:31
作者
Rubiola, E
Giordano, V
Groslambert, J
机构
[1] Politecn Torino, Dipartimento Elettron, I-10129 Turin, Italy
[2] Politecn Torino, INFM, Turin, Italy
[3] Lab Phys & Metrol Oscillateurs, F-25044 Besancon, France
关键词
D O I
10.1063/1.1149351
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The interferometric technique allows close-to-the-carrier measurements of both phase and amplitude noise, improving the instrument noise floor by 10-25 dB as compared to the traditional method based on a saturated mixer. Principles and basic equations describing the noise measurement system are given, together with design strategies suitable to microwave and very high frequency bands. Two prototypes, operating at 9 GHz and 100 MHz are discussed in detail. The relevant features of these prototypes are the capability to operate in a wide power range, below 0 dBm and above 20 dBm, and low noise floor. The latter is about -180 dB rad(2)/Hz (white) and 150 dB rad(2)/Hz (flicker) at 1 Hz Fourier frequency, at carrier power from 9 to 15 dBm. (C) 1999 American Institute of Physics. [S0034-6748(99)02301-1].
引用
收藏
页码:220 / 225
页数:6
相关论文
共 7 条
[1]  
Goldman S., 1989, PHASE NOISE ANAL RAD
[2]  
Horn C. H., 1969, Proceedings of the 23rd annual frequency control symposium, P223
[3]   A study of noise phenomena in microwave components using an advanced noise measurement system [J].
Ivanov, EN ;
Tobar, ME ;
Woode, RA .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1997, 44 (01) :161-163
[4]   Ultra-low-noise microwave oscillator with advanced phase noise suppression system [J].
Ivanov, EN ;
Tobar, ME ;
Woode, RA .
IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1996, 6 (09) :312-314
[5]   1/F AM and PM noise in bipolar transistor amplifiers: Sources, ways of influence, techniques of reduction [J].
Kuleshov, VN ;
Boldyreva, TI .
PROCEEDINGS OF THE 1997 IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM, 1997, :446-455
[7]   Origin of 1/fPM and AM noise in bipolar junction transistor amplifiers [J].
Walls, FL ;
FerrePikal, ES ;
Jefferts, SR .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1997, 44 (02) :326-334