A realistic material model for reflectance simulation

In order to simulate a correct behavior of light incident to a material, we must first understand the different interactions between light and the surface of the matter, but also between light and the inner structure of the material itself Physical measurement is a way to record a material's behavior, but is limited to preexistent object and measure conditions. Therefore, we have developed a multiresolution material model, generically describing its inner structure thanks to a microelements distribution. Then, we use this model in a virtual measure bank in order to record its response to an incident luminous radiance. Once obtained, this directional reflectance is stored, compressed and used in a rendering model such as ray tracing or radiosity.