Atomic force microscopy evidence of patterning urethane/urea copolymers

被引:8
作者
Godinho, MH [1 ]
Melo, LV
Brogueira, P
机构
[1] Univ Nova Lisboa, Fac Ciencias & Tecnol, Dept Ciencia Mat, P-2829516 Caparica, Portugal
[2] Univ Nova Lisboa, Fac Ciencias & Tecnol, CENIMAT, P-2829516 Caparica, Portugal
[3] Inst Super Tecn, Dept Phys, P-1049001 Lisbon, Portugal
[4] Inst Super Tecn, ICEMS, P-1049001 Lisbon, Portugal
来源
MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS | 2003年 / 23卷 / 6-8期
关键词
elastomer; urethane/urea; AFM; UV; bi-stable pattern;
D O I
10.1016/j.msec.2003.09.164
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The elastomeric film (60-mum thickness) was prepared from polypropylene oxide-based isocyanate-terminated triol prepolymer (PU) and polybutadiene diol (PBDO; 40% by weight). The sample was cut from the cross-linked film in the direction (d2) perpendicular to the casting rate (d1). The sample was subject to a uniaxial deformation along d2 equal to 1.3, at room temperature, under ultraviolet radiation (lambda = 254 nm) for 4 days. After removing the mechanical field, a periodic pattern was obtained in the modulated polymer surface with a wave vector parallel to d2. A bi-stable behaviour of the elastomer is revealed by sequentially applying and removing mechanical shear stress along d1 (state I) and along d2 (state II). State I is characterized by two spatial periods along d1 and d2, respectively. The AFM height profile along d1 shows variability of the wave vector value with spatial periodicities l(l)(l) ranging from 4 to 5 mum and alternating peak-to-valley heights of h(l)(1)(l) 65 +/- 12 nm and h(l)(l)2 = 140 +/- 50 nm. In contrast, the AFM height profile along d2 reveals a complex periodic structure characterized by a well-established spatial periodicity l(2)(I) = 8.47 +/- 0.12 mum. The peak-to-valley height varies between 30 and 170 nm within one spatial period in a reproducible sequence. State II is characterized by a clear spatial periodicity along d2. Within this periodicity peaks are grouped in pairs. Each pair is characterized by a spatial periodicity of l(2)(II)= 4.5 +/- 01 mum. The height difference between subsequent pairs is Delta(h)(22)(II) = 42 +/- 10 nm with a constant peak-to-valley height h(22)(II) = 290 +/- 30 nm. The profile along d1 reveals the imprint of state I. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:919 / 922
页数:4
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