Miniature quadrupole arrays for residual and process gas analysis

被引:8
作者
Boumsellek, S [1 ]
Ferran, RJ [1 ]
机构
[1] Ferran Sci Inc, San Diego, CA USA
来源
JOURNAL OF THE IEST | 1999年 / 42卷 / 01期
关键词
process gas analysis (PGA); residual gas analyzer (RGA); ray tracing; quadrupole array; space charge effects;
D O I
10.17764/jiet.42.1.p57381407j7677u0
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
This paper includes computer simulations based on ray tracing to aid in the design of miniature quadrupoles. These quadrupoles are then assembled in a matrix-like pattern to operate in parallel. The tradeoffs between sensitivity and resolution for different mechanical and electrical configurations are examined using real-time trajectories of ions. The dependence of resolution versus sensitivity is computed and compared with experimental results. The pressure dependence of the sensitivity is simulated near the upper limit (mtorr range) of the operating pressure. Space charge effects at the inlet of the mass filter are evaluated to properly design electrode apertures and spacing. Using the results of ray tracing, miniature quadrupole arrays were designed and constructed. Performance parameters were derived from recorded spectra and compared with the computations. Since they are able to operate at higher pressures, these sensor-type devices are used as residual gas analyzers (RGAs) and as process gas analyzers (PGAs) in many semiconductor applications. Networking multiple sensors to monitor the state of the semiconductor manufacturing tool and the wafers at different stages of the process enables real-time, wafer-to-wafer control using preset fault detection schemes.
引用
收藏
页码:27 / 31
页数:5
相关论文
共 2 条
[1]  
BOUMSELLEK S, 1996, P 42 ANN TECHN M I E, P1
[2]  
DAHL DA, 1995, SIMION 3D VERS 6 0 R