Origin of the boson peak in systems with lattice disorder

被引:254
作者
Taraskin, SN
Loh, YL
Natarajan, G
Elliott, SR
机构
[1] Univ Cambridge, Dept Chem, Cambridge CB2 1EW, England
[2] Univ Cambridge Trinity Coll, Cambridge CB2 1TQ, England
关键词
D O I
10.1103/PhysRevLett.86.1255
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The origin of the boson peak in models with force-constant disorder has been established by calculations using the coherent potential approximation. The analytical results obtained are supported by precise numerical solutions. The boson peak in the disordered system is associated with the lowest van Hove singularity in the spectrum of the reference crystalline system, pushed down in frequency by disorder-induced level-repelling and hybridization effects.
引用
收藏
页码:1255 / 1258
页数:4
相关论文
共 24 条
[1]  
ALEXANDER S, 1982, J PHYS LETT-PARIS, V43, pL625, DOI 10.1051/jphyslet:019820043017062500
[2]   Floppy modes in crystalline and amorphous silicates [J].
Dove, MT ;
Harris, MJ ;
Hannon, AC ;
Parker, JM ;
Swainson, IP ;
Gambhir, M .
PHYSICAL REVIEW LETTERS, 1997, 78 (06) :1070-1073
[3]  
EHRENREICH H, 1976, SOLID STATE PHYS, V31, P149, DOI [DOI 10.1016/S0081-1947(08)60543-3, 10.1016/S0081-1947(08)60543-3]
[4]   THEORY AND PROPERTIES OF RANDOMLY DISORDERED CRYSTALS AND RELATED PHYSICAL SYSTEMS [J].
ELLIOTT, RJ ;
KRUMHANS.JA ;
LEATH, PL .
REVIEWS OF MODERN PHYSICS, 1974, 46 (03) :465-543
[5]  
ELLIOTT SR, 1990, PHYSICS AMORPHOUS MA
[6]   Origin of the boson peak in a network glass B2O3 [J].
Engberg, D ;
Wischnewski, A ;
Buchenau, U ;
Börjesson, L ;
Dianoux, AJ ;
Sokolov, AP ;
Torell, LM .
PHYSICAL REVIEW B, 1999, 59 (06) :4053-4057
[7]   Numerical study of low-frequency vibrations in amorphous silicon [J].
Feldman, JL ;
Allen, PB ;
Bickham, SR .
PHYSICAL REVIEW B, 1999, 59 (05) :3551-3559
[8]  
FENG S, 1985, PHYS REV B, V31, P276, DOI 10.1103/PhysRevB.31.276
[9]  
GALPERIN YM, 1988, ZH EKSP TEOR FIZ, V67, P2386
[10]   Evolution of vibrational excitations in glassy systems [J].
Götze, W ;
Mayr, MR .
PHYSICAL REVIEW E, 2000, 61 (01) :587-606