A white-light Michelson interferometer in the visible and near infrared regions

被引：11

作者：

Fuji, T ^{[1
]}

Arakawa, M ^{[1
]}

Hattori, T ^{[1
]}

Nakatsuka, H ^{[1
]}

机构：

[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 08期

关键词：

D O I：

10.1063/1.1149024

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A white-light Michelson interferometer in the visible and near infrared regions is described which can obtain the cross-correlation interferogram between the incident light and the transmitted light through samples or optical components. By comparing the autocorrelation interferogram of the incident white light with the cross-correlation interferogram between the incident light and the transmitted Light, we can obtain linear response functions of samples or optical components with femtosecond time resolution. Fourier analysis of the interferograms gives also the complex optical constants of the samples without relying on the Kramers-Kronig relation. (C) 1998 American Institute of Physics.

引用

页码：2854 / 2858

页数：5

共 9 条

[1] MEASUREMENT OF GROUP DELAY WITH HIGH TEMPORAL AND SPECTRAL RESOLUTION [J].

BECK, M ;

WALMSLEY, IA .

OPTICS LETTERS, 1990, 15 (09) :492-494

[2] Dispersion measurements with white-light interferometry [J].

Diddams, S ;

Diels, JC .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1996, 13 (06) :1120-1129

[3] Linear propagation of light investigated with a white-light Michelson interferometer [J].

Fuji, T ;

Miyata, M ;

Kawato, S ;

Hattori, T ;

Nakatsuka, H .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1997, 14 (05) :1074-1078

[4] INTERFEROMETRIC MEASUREMENTS OF FEMTOSECOND GROUP DELAY IN OPTICAL-COMPONENTS [J].

KNOX, WH ;

PEARSON, NM ;

LI, KD ;

HIRLIMANN, CA .

OPTICS LETTERS, 1988, 13 (07) :574-576

[5] Phase-sensitive interferometry with ultrashort optical pulses [J].

Kop, RHJ ;

Sprik, R .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (12) :5459-5463

[6] SEMICONDUCTOR-LASER CAVITY DISPERSION MEASUREMENT BASED ON INTERFEROMETRIC CROSS-CORRELATION OF AMPLIFIED SPONTANEOUS EMISSION [J].

NAGANUMA, K .

APPLIED PHYSICS LETTERS, 1994, 64 (03) :261-263

[7] GROUP-DELAY MEASUREMENT USING THE FOURIER-TRANSFORM OF AN INTERFEROMETRIC CROSS-CORRELATION GENERATED BY WHITE-LIGHT [J].

NAGANUMA, K ;

MOGI, K ;

YAMADA, H .

OPTICS LETTERS, 1990, 15 (07) :393-395

[8] INTERFEROMETRIC MEASUREMENT OF WAVELENGTH DISPERSION ON FEMTOSECOND LASER CAVITIES [J].

NAGANUMA, K ;

SAKAI, Y .

OPTICS LETTERS, 1994, 19 (07) :487-489

[9] INTERFEROMETRIC OBSERVATION OF FEMTOSECOND FREE INDUCTION DECAY [J].

TSURUMACHI, N ;

FUJI, T ;

KAWATO, S ;

HATTORI, T ;

NAKATSUKA, H .

OPTICS LETTERS, 1994, 19 (22) :1867-1869

← 1 →