Contrast mechanism in superscrew dislocation images on synchrotron back-reflection topographs

被引：5

作者：

Huang, XR ^{[1
]}

Dudley, M ^{[1
]}

Vetter, WM ^{[1
]}

Huang, W ^{[1
]}

Wang, S ^{[1
]}

Carter, CH ^{[1
]}

机构：

[1] SUNY Stony Brook, Dept Mat Sci & Engn, Stony Brook, NY 11794 USA

来源：

APPLICATIONS OF SYNCHROTRON RADIATION TECHNIQUES TO MATERIALS SCIENCE IV | 1998年 / 524卷

关键词：

D O I：

10.1557/PROC-524-71

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The topographic contrast of superscrew dislocations in 6H-SiC crystals has been studied by synchrotron white-beam x-ray topography in the Bragg reflection geometry. The diffraction images of these dislocations are simulated using a ray-tracing method Systematical simulations, which coincide with the dislocation images taken by back- and grazing-reflection topography, clearly reveal the kinematic diffraction mechanisms of the superscrew dislocation, and illustrate that synchrotron reflection topography is capable of providing accurate descriptions of the strain fields, the Burgers vector magnitudes, and the senses of these dislocations. In addition, our experiments and simulations demonstrate straightforwardly the relation between the topographic contrast and the lattice distortions, and therefore the general mechanisms underlying contrast formation of defect images in synchrotron reflection topographs are provided.

引用

页码：71 / 76

页数：6