Growth and characterization of crack-free semipolar {1-101}InGaN/GaN multiple-quantum well on V-grooved (001)Si substrates

被引:20
作者
Chen, Guan-Ting [1 ]
Chang, Shih-Pang [1 ]
Chyi, Jen-Inn [1 ,3 ,4 ]
Chang, Mao-Nan [2 ]
机构
[1] Natl Cent Univ, Dept Elect Engn, Chungli 32001, Taoyuan County, Taiwan
[2] Natl Nano Device Labs, Div Nano Metrol, Hsinchu 30078, Taiwan
[3] Natl Cent Univ, Dept Opt & Photon, Taipei, Taiwan
[4] Acad Sinica, Res Ctr Appl Sci, Taipei 115, Taiwan
关键词
D O I
10.1063/1.2946655
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work elucidates the two-stage growth of GaN on V-grooved (001)Si substrates using metal-organic chemical vapor deposition. The first growth stage proceeds on the {111}Si sidewalls until GaN fills the V grooves. Then the second stage continues and leads to a semipolar surface with the {1-101}GaN facets. GaN films with thickness of over 1 mu m can be obtained without cracks by this two stage-growth. Excitation-power-dependent and time-resolved photoluminescence measurements confirm that the internal electric field in the InGaN/GaN multiple-quantum well (MQW) grown on this GaN template is indeed smaller than that of the MQW grown on (0001)GaN. (C) 2008 American Institute of Physics.
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页数:3
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