In situ study on the reorientation of polymer chains in operating polymer diodes

被引:20
作者
Guo, TF [1 ]
Yang, Y [1 ]
机构
[1] Univ Calif Los Angeles, Dept Mat Sci & Engn, Los Angeles, CA 90095 USA
关键词
D O I
10.1063/1.1430503
中图分类号
O59 [应用物理学];
学科分类号
摘要
A reflection-absorption Fourier-transform infrared spectroscopy experiment has been designed to in situ monitor poly(2-methoxy-5-(2(')-ethylhexyloxy)-1,4-phenylene vinylene) (MEH-PPV)-based polymer light-emitting diodes under stress test. This method enables the in situ study of the co-relation between device performance and the conformational transformation of a conjugated polymer. The experimental results indicate that the plane of the conjugated pi -electron cloud in MEH-PPV tends to align parallel to the substrate. This rearrangement enhances the pi-pi electron coupling and lowers the device operating voltage under high current densities. (C) 2002 American Institute of Physics.
引用
收藏
页码:148 / 150
页数:3
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