A reflection-absorption Fourier-transform infrared spectroscopy experiment has been designed to in situ monitor poly(2-methoxy-5-(2(')-ethylhexyloxy)-1,4-phenylene vinylene) (MEH-PPV)-based polymer light-emitting diodes under stress test. This method enables the in situ study of the co-relation between device performance and the conformational transformation of a conjugated polymer. The experimental results indicate that the plane of the conjugated pi -electron cloud in MEH-PPV tends to align parallel to the substrate. This rearrangement enhances the pi-pi electron coupling and lowers the device operating voltage under high current densities. (C) 2002 American Institute of Physics.