In-situ studies of electron field emission of single carbon nanotubes inside the TEM

被引:58
作者
Jin, CH
Wang, JY
Wang, MS
Su, J
Peng, LM [1 ]
机构
[1] Peking Univ, Key Lab Phys & Chem Nanodevices, Beijing 100871, Peoples R China
[2] Peking Univ, Dept Elect, Beijing 100871, Peoples R China
[3] Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, Beijing 100080, Peoples R China
基金
中国国家自然科学基金;
关键词
carbon nanotubes; electron microscopy; field emission;
D O I
10.1016/j.carbon.2004.11.038
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electron field emission characteristics of individual multi-walled carbon nanotubes (MWCNTs) were investigated in situ inside the transmission electron microscope (TEM). For a single MWCNT it was found that while field-emission can hardly occur from the side of the nanotube, a curved nanotube may result in finite side emission and the best emission geometry is the top emission geometry. Current-voltage (I-V) measurements made at different vacuum conditions and voltage sweeps emphasize the importance of the adsorbates on the electron field emission of MWCNTs. For a contaminated MWCNT, although the field emission current was reduced, the stability of its emission was improved. A current of up to several tens of mu A was observed for a single MWCNT, but it was found that long time emission usually results in drastic structure damage that may lead to sudden emission failure. (c) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1026 / 1031
页数:6
相关论文
共 11 条
[1]   Field emission from carbon nanotubes:: perspectives for applications and clues to the emission mechanism [J].
Bonard, JM ;
Salvetat, JP ;
Stöckli, T ;
Forró, L ;
Châtelain, A .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 69 (03) :245-254
[2]   Field emission of individual carbon nanotubes in the scanning electron microscope [J].
Bonard, JM ;
Dean, KA ;
Coll, BF ;
Klinke, C .
PHYSICAL REVIEW LETTERS, 2002, 89 (19) :1-197602
[3]   Controlled synthesis and phase transformation of ferrous nanowires inside carbon nanotubes [J].
Che, R ;
Peng, LM ;
Chen, Q ;
Duan, XF ;
Zou, BS ;
Gu, ZN .
CHEMICAL PHYSICS LETTERS, 2003, 375 (1-2) :59-64
[4]   Current saturation mechanisms in carbon nanotube field emitters [J].
Dean, KA ;
Chalamala, BR .
APPLIED PHYSICS LETTERS, 2000, 76 (03) :375-377
[5]   A CARBON NANOTUBE FIELD-EMISSION ELECTRON SOURCE [J].
DEHEER, WA ;
CHATELAIN, A ;
UGARTE, D .
SCIENCE, 1995, 270 (5239) :1179-1180
[6]   FIELD-EMISSION ENERGY-DISTRIBUTION (FEED) [J].
GADZUK, JW ;
PLUMMER, EW .
REVIEWS OF MODERN PHYSICS, 1973, 45 (03) :487-548
[7]  
Lohmus R, 2001, PHYS LOW-DIMENS STR, V3-4, P81
[8]   Characterization of thin film electron emitters by scanning anode field emission microscopy [J].
Nilsson, L ;
Groening, O ;
Groening, P ;
Kuettel, O ;
Schlapbach, L .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (02) :768-780
[9]   UNRAVELING NANOTUBES - FIELD-EMISSION FROM AN ATOMIC WIRE [J].
RINZLER, AG ;
HAFNER, JH ;
NIKOLAEV, P ;
LOU, L ;
KIM, SG ;
TOMANEK, D ;
NORDLANDER, P ;
COLBERT, DT ;
SMALLEY, RE .
SCIENCE, 1995, 269 (5230) :1550-1553
[10]   A SCANNING TUNNELING MICROSCOPE IN A SIDE-ENTRY HOLDER FOR REFLECTION ELECTRON-MICROSCOPY IN THE PHILIPS EM400 [J].
SPENCE, JCH .
ULTRAMICROSCOPY, 1988, 25 (02) :165-169