Trapped charge migration in BaFBr:Eu2+: The recuperation of photostimulated luminescence

被引：19

作者：

Harrison, A

Harrison, MT

Keogh, GP

Templer, RH

Wills, AS

机构：

[1] UNIV OXFORD, INORGAN CHEM LAB, OXFORD OX1 3QR, ENGLAND

[2] UNIV LONDON IMPERIAL COLL SCI & TECHNOL, DEPT CHEM, LONDON SW7 2AY, ENGLAND

来源：

PHYSICAL REVIEW B | 1996年 / 53卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.53.5039

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a model of the photostimulated luminescence (PSL) in BaFBr:Eu2+ in which the trapped charge defects are mobile, rather than static. The PSL occurs when trapped electrons and holes migrate together to form loose clusters around Eu2+, and recombine after photostimulation. The model predicts that if one measures the PSL for some time and then stops the photostimulation, the PSL measured some time later will be enhanced. We have recorded this effect and present the results as strong evidence in support of our hypothesis.

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页码：5039 / 5042

页数：4

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