Nanorheological approach for characterization of electroluminescent polymer thin films

被引：13

作者：

Gray, T ^{[1
]}

Buenviaje, C

Overney, RM

Jenekhe, SA

Zheng, LX

Jen, AKY

机构：

[1] Univ Washington, Dept Chem Engn, Seattle, WA 98195 USA

[2] Univ Washington, Dept Chem, Seattle, WA 98195 USA

[3] Univ Washington, Dept Mat Sci & Engn, Seattle, WA 98195 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 13期

关键词：

D O I：

10.1063/1.1613045

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Shear-modulated scanning force microscopy (SM-SFM) is introduced as a nanorheological characterization method for the determination of optoelectronic properties of semiconducting polymer thin films (<100 nm). In this letter, the photoluminescence quantum efficiency of poly(p-phenylenevinylene) (PPV) was directly correlated to the glass transition property by SM-SFM. Conformational changes and chain packing were discussed as a function of the conversion temperature of the soluble PPV precursor. Compared to the bulk, very low glass transition temperature values in the range of 65 to 85 degreesC were found, which imply an increased molecular mobility in thin films of conjugated polymers. (C) 2003 American Institute of Physics.

引用

页码：2563 / 2565

页数：3

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