A new 3D micro X-ray fluorescence analysis set-up - First archaeometric applications

被引：212

作者：

Kanngiesser, B

Malzer, W

Reiche, I

机构：

[1] Tech Univ Berlin, Inst Atom Phys & Teacher Training, D-10623 Berlin, Germany

[2] State Museum Berlin, Rathgen Res Lab, D-14059 Berlin, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2003年 / 211卷 / 02期

关键词：

micro-XRF; depth profiling of elemental composition; paint layers;

D O I：

10.1016/S0168-583X(03)01321-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new 3D micro X-ray fluorescence (micro-XRF) analysis method based on a confocal X-ray set-up is presented. The capabilities of this new method are evaluated and illustrated with depth sensitive investigations of paint layers in ancient Indian Mughal miniatures. Successive paint layers could be distinguished non-destructively with a depth resolution of about 10 mum. Major and minor elements are detectable and can be discriminated in different layers. New light could be shed on ancient painting techniques and materials with this new 3D micro-XRF set-up. (C) 2003 Elsevier B.V. All rights reserved.

引用

页码：259 / 264

页数：6

共 7 条

[1] SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE AT LURE [J].

BRISSAUD, I ;

WANG, JX ;

CHEVALLIER, P .

JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 1989, 131 (02) :399-413

[2]

Janssens K. H. A., 2000, MICROSCOPIC XRAY FLU

[3]

Kumakhov MA, 2000, X-RAY SPECTROM, V29, P343, DOI 10.1002/1097-4539(200009/10)29:5<343::AID-XRS414>3.0.CO

[4]

2-S

[5]

Nakai I., 1992, ADV XRAY ANAL B, V35, P1307

[6]

NAKAI I, 1991, ANAL SCI S, V7

[7]

Reiche I., 2003, PHYS UNSERER ZEIT, V34, P80

← 1 →