Causality, randomness, and the microwave background

被引:92
作者
Albrecht, A
Coulson, D
Ferreira, P
Magueijo, J
机构
[1] UNIV PENN, D RITTENHOUSE LAB, PHILADELPHIA, PA 19104 USA
[2] UNIV CALIF BERKELEY, CTR PARTICLE ASTROPHYS, BERKELEY, CA 94720 USA
[3] CAVENDISH LAB, MULLARD RADIO ASTRON OBSERV, CAMBRIDGE CB3 0HE, ENGLAND
[4] UNIV CAMBRIDGE, DEPT APPL MATH & THEORET PHYS, CAMBRIDGE CB3 9EW, ENGLAND
基金
美国国家科学基金会;
关键词
D O I
10.1103/PhysRevLett.76.1413
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Fluctuations in the cosmic microwave background (CMB) temperature are being studied with ever increasing precision. Two competing types of theories might describe the origins of these fluctuations: ''inflation'' and ''defects.'' Here we show how the differences between these two scenarios can give rise to striking signatures in the microwave fluctuations on small scales, assuming a standard recombination history. These should enable high resolution measurements of CMB anisotropies to distinguish between these two broad classes of theories, independent of the precise details of each.
引用
收藏
页码:1413 / 1416
页数:4
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