Suppression of superconductivity by crystallographic defects in epitaxial Sr2RuO4 films

被引:44
作者
Zurbuchen, MA [1 ]
Jia, YF
Knapp, S
Carim, AH
Schlom, DG
Zou, LN
Liu, Y
机构
[1] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16803 USA
[2] Penn State Univ, Dept Phys, University Pk, PA 16802 USA
关键词
D O I
10.1063/1.1364659
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial Sr2RuO4 thin films grown by pulsed-laser deposition from high-purity (99.98%) Sr2RuO4 targets on (001) LaAlO3 were found to be not superconducting down to 0.4 K. Structural disorder is believed to be responsible. A correlation was observed between higher resistivity ratios in electrical transport measurements and narrower x-ray diffraction rocking curve widths of the Sr2RuO4 films. High-resolution transmission electron microscopy revealed that the dominant structural defects, i.e., the defects leading to the observed variation in rocking curve widths in the films, are (011) planar defects, with a spacing comparable to the in-plane superconducting coherence length of Sr2RuO4. These results imply that minimizing structural disorder is the key remaining challenge to achieving superconducting Sr2RuO4 films. (C) 2001 American Institute of Physics.
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页码:2351 / 2353
页数:3
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