Dynamic X-ray imaging system based on an amorphous silicon thin-film array

被引:34
作者
Jung, N [1 ]
Alving, PL [1 ]
Busse, F [1 ]
Conrads, N [1 ]
Meulenbrugge, HM [1 ]
Rutten, W [1 ]
Schiebel, U [1 ]
Weibrecht, M [1 ]
Wieczorek, H [1 ]
机构
[1] Philips Res Labs, D-52066 Aachen, Germany
来源
PHYSICS OF MEDICAL IMAGING | 1998年 / 3336卷
关键词
dynamic x-ray imaging system; all-solid-state x-ray detectors; large area thin film electronics;
D O I
10.1117/12.317040
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
In this paper we address design concepts and performance characterization with our laboratory x-ray detector system. Key component is a 1k(2) pixel TFT switched photodiode array with a pixel pitch of 200 mu m. It is built of a-Si:H with a CsI:TI scintillator layer. The detector system can be used for radiography and fluoroscopy applications with up to 30 images/s. It shows a S/N-ratio better than 23dB at a dose of 10nGy/frame and reaches a value for DQE of more than 60% at low spatial frequencies. We have developed a new evaporation process for CsI:TI deposition directly on the array. It yields an x-ray sensitivity close to the theoretical limit and a spatial resolution on a sufficiently high level. An optimized plate design in combination with a dedicated charge sensitive readout amplifier chip lead to a very low level of electronic noise. In particular sources and properties of electronic noise and signal crosstalk have shown to be crucial for the clinical use of the new technology. The visual impression of the remaining noise in the images from our system is isotropic. This means especially that synchronous noise has been reduced to the edge of visibility.
引用
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页码:396 / 407
页数:12
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