Mode excitation from sources in two-dimensional EBG waveguides using the array scanning method

被引：21

作者：

Capolino, F ^{[1
]}

Jackson, DR

Wilton, DR

机构：

[1] Univ Houston, Dept Elect & Comp Engn, Houston, TX 77204 USA

[2] Univ Siena, Dip Ingn Informaz, I-53100 Siena, Italy

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2005年 / 15卷 / 02期

关键词：

electromagnetic bandgap (EBG) materials; Green's function; periodic structures; waveguides;

D O I：

10.1109/LMWC.2004.842805

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An efficient semianalytical algorithm for the evaluation of the field and modal excitation by a line source in a two-dimensional electromagnetic bandgap (EBG) waveguide is presented. The method allows for an accurate and efficient calculation of the near field from the source inside the EBG waveguide, as well as the amplitude of the EBG waveguide mode that is excited. The same method can be applied to a wide variety of structures, as well as other types of sources and discontinuities.

引用

页码：49 / 51

页数：3

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