Molecular orientation in diindenoperylene thin films deposited on polycrystalline gold

被引：23

作者：

Casu, M. B. ^{[1
]}

Biswas, I. ^{[1
]}

Schuster, B. -E. ^{[1
]}

Nagel, M. ^{[1
]}

Nagel, P. ^{[2
]}

Schuppler, S. ^{[2
]}

Chasse, T. ^{[1
]}

机构：

[1] Univ Tubingen, Inst Phys & Theoret Chem, D-72076 Tubingen, Germany

[2] Forschungszentrum Karlsruhe, Inst Festkorperphys, D-76021 Karlsruhe, Germany

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 02期

关键词：

D O I：

10.1063/1.2957474

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present x-ray photoemission spectroscopy (XPS) and near-edge x-ray absorption fine structure spectroscopy measurements taken on diindenoperylene (DIP) thin films of different thicknesses deposited on polycrystalline gold. Our investigations show that DIP films present flat lying molecules in the first layer, while the angle between the molecular axis and the surface increases with thickness. By using XPS, we find evidence for Stranski-Krastanov growth mode. (C) 2008 American Institute of Physics.

引用

页数：3

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