Micromagnetic predictions of bit decay caused by thermal fluctuations over long time scales

被引:8
作者
Xue, JH [1 ]
Victora, RH [1 ]
机构
[1] Univ Minnesota, Ctr Micromagnet & Informat Technol, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
关键词
D O I
10.1063/1.1355330
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thermal decay in magnetic recording media increases with time, consequently decreasing the signal-to-noise ratio. A recently developed scaling technique, based on the equivalence of time and temperature within micromagnetics, has been used to predict bit decay over long time scales. An ideal square-wave field is used to record bits in thin film magnetic recording media. Comparison of bit thermal stability for longitudinal and perpendicular thin film media with similar KuV/kT is carried out at recording densities from 50 to 400 Gbit/in.(2). Bit decay in a Co/Pd superlattice film at similar to 100 Gbit/in.(2) is also studied. (C) 2001 American Institute of Physics.
引用
收藏
页码:6985 / 6987
页数:3
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