Ensemble-averaged Shack-Hartman wave-front sensing for imaging through turbid media

被引:11
作者
Leith, EN [1 ]
Hoover, BG [1 ]
Dilworth, DS [1 ]
Naulleau, PP [1 ]
机构
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Ann Arbor, MI 48109 USA
来源
APPLIED OPTICS | 1998年 / 37卷 / 17期
关键词
D O I
10.1364/AO.37.003643
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A technique is described for ensemble-averaging the light wave emerging from a turbid medium, enabling the recovery of optical information that is otherwise lost in a speckle pattern. The technique recovers both an amplitude and a phase function for a wave that has been corrupted by severe scattering, without the use of holography. With the phase estimated, an ensemble-averaged held is constructed that can be backprojected to form an image of the object obscured by the scattering medium. Experimental results suggest that the technique can resolve two object points whose signals are unresolved on the exit surface of a diffuser. (C) 1998 Optical Society of America.
引用
收藏
页码:3643 / 3650
页数:8
相关论文
共 13 条
[1]  
ALFANO RR, 1996, ODA TRENDS OPTICS PH, V2
[2]  
[Anonymous], 1978, OPT SHOP TEST
[3]  
Chanan G., 1988, P SOC PHOTO-OPT INS, V1036, P59
[4]   RECONSTRUCTION OF AN OBJECT FROM MODULUS OF ITS FOURIER-TRANSFORM [J].
FIENUP, JR .
OPTICS LETTERS, 1978, 3 (01) :27-29
[5]   COHERENT IMAGE SYNTHESIS FROM WAVE-FRONT SENSOR MEASUREMENTS OF A NONIMAGED LASER SPECKLE FIELD - A LABORATORY DEMONSTRATION [J].
GONGLEWSKI, JD ;
IDELL, PS ;
VOELZ, DG ;
DAYTON, DC ;
SPIELBUSCH, BK ;
PIERSON, RE .
OPTICS LETTERS, 1991, 16 (23) :1893-1895
[6]  
GOODMAN JW, 1996, INTRO FOURIER OPTICS, pCH2
[7]   ACTIVE OPTICS - NEW TECHNOLOGY FOR CONTROL OF LIGHT [J].
HARDY, JW .
PROCEEDINGS OF THE IEEE, 1978, 66 (06) :651-697
[8]  
LABEYRIE A, 1970, ASTRON ASTROPHYS, V6, P85
[9]   Ensemble-averaged imaging through highly scattering media [J].
Leith, E ;
Naulleau, P ;
Dilworth, D .
OPTICS LETTERS, 1996, 21 (20) :1691-1693
[10]   Time-gated ensemble-averaged imaging through highly scattering media [J].
Naulleau, P ;
Leith, E ;
Chen, H ;
Hoover, B ;
Lopez, J .
APPLIED OPTICS, 1997, 36 (17) :3889-3894