Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements

被引:10
作者
Salvan, G [1 ]
Himcinschi, C [1 ]
Kobitski, AY [1 ]
Friedrich, M [1 ]
Wagner, HP [1 ]
Kampen, TU [1 ]
Zahn, DRT [1 ]
机构
[1] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany
关键词
PTCDA; silicon; Raman; infrared; photoluminescence spectroscopy;
D O I
10.1016/S0169-4332(01)00069-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Optical spectroscopies: Raman, infrared (IR) and photoluminescence (PL) were used to investigate the influence of the substrate temperature on the him formation of the organic molecule 3,4,9,10-perylenetetracarboxyl dianhydride (PTCDA) on hydrogen-passivated silicon(1 0 0) substrates. Raman spectra exhibit four phonon bands below 125 cm(-1), indicating the crystalline nature of the films. The spectral changes of both Raman- and infrared-active modes reflect that the size of the individual crystals increases with the substrate temperature during growth. Moreover, they support an increase in the content of the alpha -phase at the expense of the beta -phase. The rising background in the high frequency range of the Raman spectra is related to an enhancement of the PL efficiency connected to a reduced number of non-radiative centres of recombination. Time-resolved PL measurements reveal that the PL decay time increases with the substrate temperature, approaching the value characteristic for a PTCDA single crystal. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:363 / 368
页数:6
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