Characterization of defects in the formation process of self-assembled thiol monolayers by electrochemical impedance spectroscopy

被引:95
作者
Diao, P [1 ]
Guo, M
Tong, RT
机构
[1] Peking Univ, Coll Chem & Mol Engn, Beijing 100871, Peoples R China
[2] Hebei Med Univ, Tradit Chinese Med Coll, Dept Tradit Chinese Pharm, Shijiazhuang 050091, Peoples R China
[3] Hebei Teachers Univ, Dept Chem, Shijiazhuang 050016, Peoples R China
来源
JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 2001年 / 495卷 / 02期
关键词
self-assembled monolayer; octadecanethiol; fractional coverage; defect; a.c; impedance;
D O I
10.1016/S0022-0728(00)00424-1
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Self-assembled monolayers of octadecanethiol (ODT) on gold have been studied by electrochemical impedance spectroscopy (EIS). The fractional coverage, pinhole size and separation have been examined as a function of immersion time of Au in the ODT deposition solution. The fractional coverage of ODT monolayer increases sharply from zero to more than 99% of its maximum within the first minute. However, it takes hours or a day for the fractional coverage to approach its final value. The pinhole separation increases from ca. 1.8 mum to 53 mum as the assembling time increases from 5 s to 24 h, indicating that the number of pinholes decreases. The pinhole radius increases slowly from ca. 0.3 mum to 1.6 mum in the same time interval. The slight trend of increasing pinhole size with adsorption time is attributed to the increasing influence of collapsed sites in the ODT monolayer. (C) 2001 Elsevier Science B.V. All rights reserved.
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页码:98 / 105
页数:8
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