Characterization of the five-fold plane surface of an Al70.4Pd21.4Mn8.2 quasi-crystal by means of surface X-ray diffraction

被引：24

作者：

Alvarez, J

Calvayrac, Y

Joulaud, JL

Capitan, MJ

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[2] CNRS, Ctr Etud Chim Met, F-94407 Vitry Sur Seine, France

来源：

SURFACE SCIENCE | 1999年 / 423卷 / 2-3期

关键词：

morphology; quasi-crystal; roughness and topography; surface structure; synchrotron radiation surface X-ray diffraction;

D O I：

10.1016/S0039-6028(99)00002-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The surface of a five-fold symmetry quasi-crystal of a thermodynamically stable icosahedral Al70.4Pd21.4Mn8.2 single grain has been studied by means of X-ray diffraction. The calculated intensity reproduces rather well both the Bragg peaks and surface signal. The fit of the measured structure factor shows a contraction of the outermost atomic layer. The system also tends to be richer in Al and Pd, the atoms forming a very dense outer layer. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：L251 / L257

页数：7

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