Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure:: quantitative grazing-incidence X-ray scattering analysis

被引：36

作者：

Heo, Kyuyoung ^{[1
,2
]}

Yoon, Jinhwan ^{[1
,2
]}

Jin, Sangwoo ^{[1
,2
]}

Kim, Jehan ^{[1
,2
]}

Kim, Kwang-Woo ^{[1
,2
]}

Shin, Tae Joo ^{[1
,2
]}

Chung, Bonghoon ^{[1
,2
]}

Chang, Taihyun ^{[1
,2
]}

Ree, Moonhor ^{[1
,2
]}

机构：

[1] Polymer Res Inst, Ctr Integrated Mol Syst, Dept Chem, Natl Res Lab Polymer Synth & Phys,Pohang Accelera, Pohang 790784, South Korea

[2] Pohang Univ Sci & Technol, BK Sch Mol Sci, Pohang 790784, South Korea

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2008年 / 41卷

关键词：

D O I：

10.1107/S0021889808001271

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information ( shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods.

引用

页码：281 / 291

页数：11

共 58 条

[1] Structure of shear-induced perforated layer phase in styrene-isoprene diblock copolymer melts [J].