How ATE planning affects LSI manufacturing cost

被引：8

作者：

Nakamae, K

Sakamoto, H

Fujioka, H

机构：

[1] Dept. of Info. Systems Engineering, Osaka University, Osaka

[2] Mitsubishi Heavy Industries, Ltd.

[3] Dept. of Info. Systems Engineering, Faculty of Engineering

[4] Dept. Info. Systems Engineering, Faculty of Engineering, Osaka University, Suita, Osaka, 565

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1996年 / 13卷 / 04期

关键词：

D O I：

10.1109/54.544538

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

To analyze the effects of automatic test equipment planning on total LSI manufacturing cost, the authors combine event scheduling and detailed parametric models in a program that simulates the manufacturing process.

引用

页码：66 / 73

页数：8