In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers

The formation of self-assembled monolayers of octadecylsiloxane adsorbed from dilute solutions of octadecyltrichlorosilane in toluene onto freshly cleaved mica surfaces was investigated using atomic force microscopy (AFM) in tapping mode as a well-suited tool to obtain local information on the adsorption process. Three different measurement methods have been used: ex situ measurements and in situ measurements under stopped flow/deposition as well as continuous flow/deposition conditions. Although valuable information on the growth process can be obtained under stable and reproducible conditions with all methods addressed, in situ measurements bear a number of significant advantages for the investigation of such dynamic processes. (C) 1999 Elsevier Science B.V. All rights reserved.