Open-ended metallized ceramic coaxial probe for high-temperature dielectric properties measurements

被引：18

作者：

Bringhurst, S ^{[1
]}

Iskander, MF ^{[1
]}

机构：

[1] UNIV UTAH,DEPT ELECT ENGN,SALT LAKE CITY,UT 84112

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1996年 / 44卷 / 06期

关键词：

D O I：

10.1109/22.506453

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A metallized ceramic coaxial probe has been developed for high temperature complex permittivity measurements, The probe is made of alumina and metallized with a 3.0-mil-thick layer of moly-manganese, and a 0.5-mil-thick protective coating of nickel plating, It is shown that based on carrying out the network analysis calibration procedure up to 1000 degrees C, and on actual dielectric properties measurements, the probe provides accurate dielectric measurements over a broad frequency range (500 MHz to 3 GHz) and for temperatures up to 1000 degrees C. An uncertainty analysis based on two different calibration techniques was also given to help quantity possible measurement errors.

引用

页码：926 / 935

页数：10

共 18 条

[1]

ANDRADE OM, 1992, MATER RES SOC SYMP P, V269, P527, DOI 10.1557/PROC-269-527

[2]

[Anonymous], 1958, 589 NAT BUR STAND

[3] ANALYSIS OF AN OPEN-ENDED COAXIAL PROBE WITH LIFT-OFF FOR NONDESTRUCTIVE TESTING [J].