Fractal surface characterization: Implications for plasmon polariton scattering

被引:22
作者
Bozhevolnyi, SI [1 ]
Vohnsen, B [1 ]
Zayats, AV [1 ]
Smolyaninov, II [1 ]
机构
[1] RUSSIAN ACAD SCI,INST SPECT,TROITSK 142092,RUSSIA
关键词
amorphous thin films; gold; plasmons; surface waves;
D O I
10.1016/0039-6028(96)00012-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We compare the scattering of surface plasmon polaritons (SPPs) at relatively smooth and rough surfaces of gold films and relate the difference in the SPP behaviour to the difference in fractality of the studied surfaces. The rough surface, which results in the strong localization of SPPs, is found to have a fractal structure with a normalized fractal dimension D approximate to 2.26 in the spatial range 80-640 nm. It is shown that the smooth surface, which supports well-pronounced propagating SPPs, cannot be viewed as a fractal structure for discretization steps exceeding 80 nm. We conclude that in order for SPPs to be localized by surface roughness, the surface should exhibit a fractal structure in a sufficiently large range of sizes around the SPP wavelength.
引用
收藏
页码:268 / 274
页数:7
相关论文
共 20 条
[1]   DETERMINATION OF THE SPATIAL EXTENSION OF THE SURFACE-PLASMON EVANESCENT FIELD OF A SILVER FILM WITH A PHOTON SCANNING TUNNELING MICROSCOPE [J].
ADAMS, PM ;
SALOMON, L ;
DEFORNEL, F ;
GOUDONNET, JP .
PHYSICAL REVIEW B, 1993, 48 (04) :2680-2683
[2]   LOCALIZATION OF THE SURFACE-PLASMON POLARITON CAUSED BY RANDOM ROUGHNESS AND ITS ROLE IN SURFACE-ENHANCED OPTICAL PHENOMENA [J].
ARYA, K ;
SU, ZB ;
BIRMAN, JL .
PHYSICAL REVIEW LETTERS, 1985, 54 (14) :1559-1562
[3]  
BIELEFELDT H, 1993, NEAR FIELD OPTICS, P281
[4]   DIRECT OBSERVATION OF SURFACE POLARITON LOCALIZATION CAUSED BY SURFACE-ROUGHNESS [J].
BOZHEVOLNYI, SI ;
VOHNSEN, B ;
SMOLYANINOV, II ;
ZAYATS, AV .
OPTICS COMMUNICATIONS, 1995, 117 (5-6) :417-423
[5]   NEAR-FIELD MICROSCOPY OF SURFACE-PLASMON POLARITONS - LOCALIZATION AND INTERNAL INTERFACE IMAGING [J].
BOZHEVOLNYI, SI ;
SMOLYANINOV, II ;
ZAYATS, AV .
PHYSICAL REVIEW B, 1995, 51 (24) :17916-17924
[6]   CORRELATION BETWEEN OPTICAL AND TOPOGRAPHICAL IMAGES FROM AN EXTERNAL REFLECTION NEAR-FIELD MICROSCOPE WITH SHEAR FORCE FEEDBACK [J].
BOZHEVOLNYI, SI ;
SMOLYANINOV, II ;
KELLER, O .
APPLIED OPTICS, 1995, 34 (19) :3793-3799
[7]   SCANNING TUNNELING OPTICAL MICROSCOPY [J].
COURJON, D ;
SARAYEDDINE, K ;
SPAJER, M .
OPTICS COMMUNICATIONS, 1989, 71 (1-2) :23-28
[8]   IMAGING OF SURFACE-PLASMON LAUNCH AND PROPAGATION USING A PHOTON SCANNING TUNNELING MICROSCOPE [J].
DAWSON, P ;
SMITH, KW ;
DEFORNEL, F ;
GOUDONNET, JP .
ULTRAMICROSCOPY, 1995, 57 (2-3) :287-292
[9]   IMAGING OF SURFACE-PLASMON PROPAGATION AND EDGE INTERACTION USING A PHOTON SCANNING TUNNELING MICROSCOPE [J].
DAWSON, P ;
DEFORNEL, F ;
GOUDONNET, JP .
PHYSICAL REVIEW LETTERS, 1994, 72 (18) :2927-2930
[10]   RESOLUTION OF THE PHOTON SCANNING TUNNELING MICROSCOPE - INFLUENCE OF PHYSICAL PARAMETERS [J].
DEFORNEL, F ;
SALOMON, L ;
ADAM, P ;
BOURILLOT, E ;
GOUDONNET, JP ;
NEVIERE, M .
ULTRAMICROSCOPY, 1992, 42 :422-429