Polarimetric characterization of federal standard paints

被引:35
作者
Goldstein, DH [1 ]
机构
[1] USAF, Res Lab, Eglin AFB, FL 32542 USA
来源
POLARIZATION ANALYSIS, MEASUREMENT, AND REMOTE SENSING III | 2000年 / 4133卷
关键词
polarimetry; spectropolarimeter; Mueller matrix; paint; polarizance;
D O I
10.1117/12.406618
中图分类号
TP7 [遥感技术];
学科分类号
081102 ; 0816 ; 081602 ; 083002 ; 1404 ;
摘要
A limited polarimetric characterization of paint samples on aluminum substrates is presented. Twelve painted aluminum panels, representing various colors, reflectances, and surface finishes, were examined in a spectropolarimetric reflectometer. Data were analyzed in detail for the 0.9 to 1.0 micrometer wavelength region, although data were taken over a wider spectral range. Polarizance was measured for the twelve samples at eight input beam incidence angles. All observations were made from normal to the sample. Characterization of the surface roughness of the samples was done using profilometers. It was found that as the incidence beam angle increases, the polarizance increases; and as the reflectance of the sample decreases, the polarizance increases.
引用
收藏
页码:112 / 123
页数:12
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