Fabrication and characterization of contiguous permanent magnet junctions

被引：8

作者：

Xiao, M ^{[1
]}

Devasahayam, AJ ^{[1
]}

Kryder, MH ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1998年 / 34卷 / 04期

基金：

美国国家科学基金会;

关键词：

contiguous permanent magnet junctions; domain stabilization; lift-off; longitudinal bias;

D O I：

10.1109/20.706594

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper addresses several important issues concerning contiguous permanent magnet biased magnetoresistive sensors. A fabrication process utilizing isotropically etched silicon nitride for lift-off is described, and the optimization of the permanent magnet materials is presented. From the study of resistance vs. trackwidth and sensor height, a component of the resistance inversely propotional to the sensor height Is identified. The effective longitudinal bias field is found to decrease with increasing trackwidth.

引用

页码：1495 / 1497

页数：3