Quantized tunneling current in the metallic nanogaps formed by electrodeposition and etching

被引:108
作者
Li, CZ [1 ]
He, HX [1 ]
Tao, NJ [1 ]
机构
[1] Florida Int Univ, Dept Phys, Miami, FL 33199 USA
关键词
D O I
10.1063/1.1332406
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have studied electron tunneling across the gap between two electrodes as the gap is varied by electrodeposition and etching. The tunneling current tends to change in a stepwise fashion, corresponding to a discrete change of the gap width. The stepwise change is due to the discrete nature of atoms and a series of structural relaxations of the atoms at the electrodes between stable configurations upon deposition and etching. By stabilizing the tunneling current on various steps using a feedback loop, we have demonstrated that stable molecular-scale gaps can be fabricated with subangstrom precision. (C) 2000 American Institute of Physics. [S0003-6951(00)00651-3].
引用
收藏
页码:3995 / 3997
页数:3
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