First experiments on diffraction-enhanced imaging at LNLS

被引:14
作者
Giles, C [1 ]
Hönnicke, MG
Lopes, RT
Rocha, HS
Gonçalves, OD
Mazzaro, I
Cusatis, C
机构
[1] Univ Estadual Campinas, Inst Fis, BR-13081970 Campinas, SP, Brazil
[2] Lab Nacl Luz Sincrotron, Campinas, SP, Brazil
[3] Univ Fed Parana, Dept Fis, BR-80060000 Curitiba, Parana, Brazil
[4] Univ Fed Rio de Janeiro, COPPE, BR-21945 Rio De Janeiro, Brazil
[5] Univ Fed Rio de Janeiro, Inst Fis, Rio De Janeiro, Brazil
关键词
X-ray imaging; phase-contrast imaging; diffraction-enhanced imaging; X-ray optics; HARD X-RAYS; PHASE-CONTRAST; SYNCHROTRON-RADIATION;
D O I
10.1107/S0909049503020144
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Diffraction-enhanced images have been obtained using two silicon crystals in a non-dispersive set-up at the XRD2 beamline at the Brazilian Synchrotron Light Laboratory (LNLS). A first asymmetrically cut silicon crystal using the (333) reflection vertically expanded the monochromated beam from 1 mm to 20 mm allowing the imaging of the whole sample without movements. A symmetrically cut Si( 333) second crystal was used as a Bragg analyzer. Images of biological samples including human tissue were recorded using a direct-conversion CCD detector resulting in enhancement of the contrast compared with absorption-contrast images.
引用
收藏
页码:421 / 423
页数:3
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