Orientation sensitive EELS-analysis of boron nitride nanometric hollow spheres

被引：51

作者：

Souche, C

Jouffrey, B

Nelhiebel, M

机构：

[1] Ecole Cent Paris, LMSS Mat URA 850, F-92295 Chatenay Malabry, France

[2] Off Natl Etud & Rech Aerosp, CNRS, LEM, F-92322 Chatillon, France

[3] Vienna Univ Technol, Inst Angew & Tech Phys, A-1040 Vienna, Austria

来源：

MICRON | 1998年 / 29卷 / 06期

关键词：

hexagonal boron nitride; EELS; transmission electron microscopy;

D O I：

10.1016/S0968-4328(98)00030-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We present a theory for the inelastic scattering cross-section in hexagonal boron nitride. Explicitly accounting for effects of beam convergence and a finite collection aperture, we present an approach that well describes the form of the observed Boron K-edge. We use this technique to investigate the crystallographic structure of boron nitride nanometric hollow spheres. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：419 / 424

页数：6

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