Structural and optical characterisation of holey fibres using scanning probe microscopy

被引：4

作者：

Hillman, CWJ ^{[1
]}

Brocklesby, WS ^{[1
]}

Monro, TM ^{[1
]}

Belardi, W ^{[1
]}

Richardson, DJ ^{[1
]}

机构：

[1] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England

来源：

ELECTRONICS LETTERS | 2001年 / 37卷 / 21期

关键词：

D O I：

10.1049/el:20010874

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An investigation of a holey fibre using scanning probe microscopy techniques, which the authors believe is the first such investigation, is presented. Atomic force microscopy images provide knowledge of the fibre structure without the artefacts associated with scanning electron microscopy imaging. A tapered fibre scanning near-field optical microscopy probe has been used to investigate holey fibre modes at 785 nm.

引用

页码：1283 / 1284

页数：2

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